发明名称 Plane waves to control critical dimension
摘要 The present invention describes an aperture including: an opaque plate; two sliver openings located in the opaque plate, the two sliver openings having rectangular shapes, the two sliver openings being parallel to each other. The present invention further describes a method including: decomposing a pattern into horizontal sub-features and vertical sub-features; forming a first mask corresponding to the horizontal sub-features; forming a second mask corresponding to the vertical sub-features; forming a first aperture with two parallel horizontal sliver openings corresponding to the first mask; forming a second aperture with two parallel vertical sliver openings corresponding to the second mask; exposing a wafer using the first aperture and the first mask; exposing the wafer using the second aperture and the second mask; and exposing the wafer with the third mask.
申请公布号 US2009097147(A1) 申请公布日期 2009.04.16
申请号 US20080316711 申请日期 2008.12.16
申请人 LIU PENG 发明人 LIU PENG
分类号 G02B5/00 主分类号 G02B5/00
代理机构 代理人
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