发明名称 METHODS FOR MANUFACTURING THIN-FILM TRANSISTOR AND DISPLAY DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a method for manufacturing a highly-reliable thin-film transistor with a small amount of leakage current. SOLUTION: The method for manufacturing the highly-reliable thin-film transistor is provided in which a back channel portion is formed in the thin-film transistor by etching using a resist mask, then the resist mask is removed and a part of back channel portion is etched to remove etching residue or the like on the back channel portion, thereby a leakage current caused by the residue or the like can be reduced. Dry etching using no bias is preferably used for further etching the back channel portion. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009081422(A) 申请公布日期 2009.04.16
申请号 JP20080213562 申请日期 2008.08.22
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 MIYAIRI HIDEKAZU;SASAGAWA SHINYA;ISHIZUKA AKIHIRO
分类号 H01L29/786;G09F9/30;H01L21/336 主分类号 H01L29/786
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