发明名称 |
METHODS FOR MANUFACTURING THIN-FILM TRANSISTOR AND DISPLAY DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a method for manufacturing a highly-reliable thin-film transistor with a small amount of leakage current. SOLUTION: The method for manufacturing the highly-reliable thin-film transistor is provided in which a back channel portion is formed in the thin-film transistor by etching using a resist mask, then the resist mask is removed and a part of back channel portion is etched to remove etching residue or the like on the back channel portion, thereby a leakage current caused by the residue or the like can be reduced. Dry etching using no bias is preferably used for further etching the back channel portion. COPYRIGHT: (C)2009,JPO&INPIT |
申请公布号 |
JP2009081422(A) |
申请公布日期 |
2009.04.16 |
申请号 |
JP20080213562 |
申请日期 |
2008.08.22 |
申请人 |
SEMICONDUCTOR ENERGY LAB CO LTD |
发明人 |
MIYAIRI HIDEKAZU;SASAGAWA SHINYA;ISHIZUKA AKIHIRO |
分类号 |
H01L29/786;G09F9/30;H01L21/336 |
主分类号 |
H01L29/786 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|