发明名称 METHODS AND SYSTEMS FOR INTERFEROMETRIC ANALYSIS OF SURFACES AND RELATED APPLICATIONS
摘要 A method for determining a spatial property of an object includes obtaining a scanning low coherence interference signal from a measurement object that includes two or more interfaces. The scanning low coherence interference signal includes two or more overlapping low coherence interference signals, each of which results from a respective interface. Based on the low coherence interference signal, a spatial property of at least one of the interfaces is determined. In some cases, the determination is based on a subset of the low coherence interference signal rather than on the entirety of the signal. Alternatively, or in addition, the determination can be based on a template, which may be indicative of an instrument response of the interferometer used to obtain the low coherence interference signal.
申请公布号 US2009096980(A1) 申请公布日期 2009.04.16
申请号 US20080262375 申请日期 2008.10.31
申请人 DE GROOT PETER J 发明人 DE GROOT PETER J.
分类号 G02F1/1341;G01B9/02;G01B11/00;G01B11/02;G01B11/06;G03F7/20;G03F9/00 主分类号 G02F1/1341
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