| 摘要 |
A semiconductor test device and a method of testing of the same is provided to perform a test of a multi-word line by precharging a word line according to a test signal. A test signal decoder(40) comprises a first and a second burn test signal generating units(42,44). A first test signal generating unit at least one of first test signal(TAW) of a plurality of burn-in test mode signals(TM(1:4)) in the enable state. A second burn in test signal generating unit outputs a second burn in test signal(TFX(0:3)) by combining a plurality of burn-in test mode signals. Each bank control unit(46) a perform multi word line test by producing the multi word line test signal.
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