发明名称 Contact structure of a semiconductor device
摘要 In one embodiment, a semiconductor device comprises a conductive pad formed in a semiconductor substrate. The semiconductor device further includes a conductive pattern overlying a peripheral region of the conductive pad. The conductive pattern has an opening to expose another region of the conductive pad. The semiconductor device also includes a conductive contact extending through the opening. The conductive contact is electrically connected to the conductive pad. As a result, manufacturing cost for the semiconductor device may be reduced while manufacturing throughput may be improved.
申请公布号 US7518245(B2) 申请公布日期 2009.04.14
申请号 US20040875008 申请日期 2004.06.22
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 PARK JE-MIN
分类号 H01L23/48;H01L27/108;H01L21/00;H01L21/28;H01L21/60;H01L21/768;H01L21/8242;H01L23/52;H01L27/105 主分类号 H01L23/48
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