发明名称 Surface profile measurement processing method
摘要 In one general aspect, a method of processing surface profile measurements includes obtaining a calibration image, the calibration image including one or more surface profile measurements at one or more discrete points on a surface, performing calibration processing on the surface profile measurements, performing data processing on the surface profile measurements, and providing data output based upon the calibration processing and the data processing.
申请公布号 US7519502(B1) 申请公布日期 2009.04.14
申请号 US20070726197 申请日期 2007.03.14
申请人 THE UNITED STATES OF AMERICA AS REPRESENTED BY THE SECRETARY OF THE NAVY 发明人 CARNEAL JASON BRADLEY;ATSAVAPRANEE PAISAN;SHAN JERRY WEI-JEN
分类号 G01B7/28 主分类号 G01B7/28
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