发明名称 1-TRANSISTOR TYPE DRAM DRIVING METHOD
摘要 One1-transistor type dram driving method is provided to increase the reliability of a cell and increase read speed since cell data is not broken in read mode. A word line of NMOS transistor is inactivated and data is retained by making a source line and a bit lien precharged at a first hold section. The word line is activated of the NMOS transistor at a combination section after the first hold section. The voltage of the source line and a bit lien is transited the ground voltage and NMOS transistor and bipolar transistor are operated. The world line of the NMOS transistor is inactivated and only the bipolar transistor is operated after the combination section. The source line and the bit line of NMOS transistor are precharged so that data is retained at a second hold section.
申请公布号 KR100892731(B1) 申请公布日期 2009.04.10
申请号 KR20080000288 申请日期 2008.01.02
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KANG, HEE BOK;HONG, SUK KYOUNG
分类号 G11C11/40 主分类号 G11C11/40
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