| 摘要 |
FIELD: physics; electronics. ^ SUBSTANCE: invention can be used in microelectronic systems of processing of analogue signals and transformations of analogue information in digital, in particular, in high-speed analogue-digital transformers (ADT). The voltage comparator (VC) includes device of sample-storage of input signal (SSD) on switched condensers with unitary or double sample and, at least, one differential amplifier (DA) with a pair of input MOS transistors of the first type with the general source connected to cell, and sinks connected to drains of first and second pairs of MOS transistors of the second type and forming differential DA exits, and between shutters of first pair of MOS transistors of the second type and the general busbar of sources of first and second pair of MOS transistors of the second type the pair of condensers is included, shutters of second pair of MOS transistors of the second type are connected crosswise to the drains of opposite transistors of pair, forming the plus feedback, and DA differential exits are shunted with MOS key. DA works with alternating stages of zeroing and comparison, and the stage of zeroing DA comes to end after the moment of sample of the SSD input signal with cutout of shutters of the first pair of transistors of the second type from the drains then the DA source increases current, at least, on response time of the plus feedback of the second MOS pair of transistors of the second type. The MOS key shunts differential DA exits only for the period of switching SSD from sample phase in phase of comparison and formation on the DA inlets of signal of sufficient amplitude. ^ EFFECT: speed and accuracy increase, reduction of consumption and power of differential voltage comparators with sample of differential input signal. ^ 10 cl, 8 dwg |
