发明名称 |
CHEMICAL MECHANICAL POLISHING COMPOSITION FOR SILICON NITRIDE LAYER |
摘要 |
A slurry composition is provided to polish a silicon nitride film and to be used as slurry which selectively polishes the silicon nitride film by being applied to the chemical mechanical polishing of a substrate including the silicon oxide film and silicon nitride film. A slurry composition for chemical mechanical polishing of a silicon nitride film contains an abrasive selected from zeolite or aluminosilicate and has pH of 1-7. The content of the abrasive based on the total weight of the slurry composition is 0.01-10 weight%. The slurry composition further contains at least one selected from a boric acid, carboxylic acid or amino acid.
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申请公布号 |
KR20090035063(A) |
申请公布日期 |
2009.04.09 |
申请号 |
KR20070100112 |
申请日期 |
2007.10.05 |
申请人 |
TECHNO SEMICHEM CO., LTD. |
发明人 |
KIM, SEOK JU;PARK, HYU BUM;HAN, DEOK SU |
分类号 |
C09K3/14 |
主分类号 |
C09K3/14 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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