发明名称 CHEMICAL MECHANICAL POLISHING COMPOSITION FOR SILICON NITRIDE LAYER
摘要 A slurry composition is provided to polish a silicon nitride film and to be used as slurry which selectively polishes the silicon nitride film by being applied to the chemical mechanical polishing of a substrate including the silicon oxide film and silicon nitride film. A slurry composition for chemical mechanical polishing of a silicon nitride film contains an abrasive selected from zeolite or aluminosilicate and has pH of 1-7. The content of the abrasive based on the total weight of the slurry composition is 0.01-10 weight%. The slurry composition further contains at least one selected from a boric acid, carboxylic acid or amino acid.
申请公布号 KR20090035063(A) 申请公布日期 2009.04.09
申请号 KR20070100112 申请日期 2007.10.05
申请人 TECHNO SEMICHEM CO., LTD. 发明人 KIM, SEOK JU;PARK, HYU BUM;HAN, DEOK SU
分类号 C09K3/14 主分类号 C09K3/14
代理机构 代理人
主权项
地址