发明名称 SPECTRAL MEASURING INSTRUMENT, SPECTRAL MEASURING METHOD AND SPECTRAL MEASURING PROGRAM
摘要 PROBLEM TO BE SOLVED: To provide a spectral measuring instrument, a spectral measuring method, and a spectral measuring program which can be preferably used for the evaluation of a light-emitting material. SOLUTION: The spectral measuring instrument 1A is equipped with the integrating sphere 20 arranged in a sample S and having an incident opening part 21 on which exciting light is thrown and an emitting opening part 22 for emitting the light to be measured from the sample S, a spectral analyzer 30 for spectrally diffracting the light to be measured to acquire a wavelength spectrum, and a data analyzer 50. The data analyzer 50 has a target region setting part for setting the first target region corresponding to the exciting light in the wavelength spectrum and the second target region corresponding to the emission from the sample S, a weight coefficient setting part for variably setting a weight coefficient with respect to at least one of the wavelength spectra in the first and second regions and a sample data analyzing part for analyzing the wavelength spectra using the first and second regions and the weight coefficient to acquire the data related to the sample S. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009074866(A) 申请公布日期 2009.04.09
申请号 JP20070242887 申请日期 2007.09.19
申请人 HAMAMATSU PHOTONICS KK 发明人 IGUCHI KAZUYA;SUZUKI KENGO
分类号 G01N21/64;G01N21/01 主分类号 G01N21/64
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