发明名称 EMI RESONANCE LINE TEST DEVICE AND EMI RULER
摘要 PROBLEM TO BE SOLVED: To provide an EMI resonance line test device and an effective EMI ruler for the EMI resonance line test device which can evaluate an EMI test object at a general environment so as to reduce the EMI test expense. SOLUTION: By stabilizing a connection connecting a first probe into the EMI test object as an earth structure, the resonance frequency of the EMI test object can be measured by a frequency analyzer. Further, when a relationship between the frequency analyzer and EMI test object is at the resonance state, the number of the maximum points of an electric field or magnetic field generated by the EMI test object is detected for the EMI test object by a second probe without contact. The signal from the first probe and the signal from the second probe are switched by an installed selector switch, and the signals are supplied to the frequency analyzer. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009075095(A) 申请公布日期 2009.04.09
申请号 JP20080218089 申请日期 2008.08.27
申请人 LINCOLN KOSHUHA:KK 发明人 SEKI YOSHINORI;SEKI FUMIKO
分类号 G01R29/08 主分类号 G01R29/08
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