发明名称 SAMPLE ANALYZER
摘要 PROBLEM TO BE SOLVED: To provide a sample analyzer capable of analyzing light at different wavelength bands using one analyzer. SOLUTION: The sample analyzer comprises: a first movable stage capable of moving a sample in width and depth directions while the sample is placed on the movable stage; a light source for applying X rays, ultraviolet rays, visible light, or infrared rays to the sample; a detector for detecting transmission light or fluorescence generated by the irradiation of light; a second movable stage capable of moving the detector in width and height directions while the detector is mounted to the movable stage; and a casing including the first movable stage, the light source, the detector, and the second movable stage inside. The light source is one of an X-ray light source, an ultraviolet ray light source, a visible light source, and an infrared ray light source, one of the light sources is mounted in the casing so that it can be exchanged with other light sources, and the detector is mounted so that it can be relocated to either a mount position for detecting transmission light or that for detecting fluorescence set to the second movable stage according to the light sources. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009074934(A) 申请公布日期 2009.04.09
申请号 JP20070244273 申请日期 2007.09.20
申请人 MIURA SENSOR LABORATORY INC 发明人 MIURA GAICHI
分类号 G01N23/04;G01N21/27;G01N21/64 主分类号 G01N23/04
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