| 摘要 |
PROBLEM TO BE SOLVED: To provide a measuring method for hysteresis circuit capable of accurately testing a hysteresis circuit in a short time. SOLUTION: In measuring the minimum value of a rising threshold, the maximum value of the rising threshold, the maximum value of a falling threshold, the minimum value of the falling threshold, and a hysteresis minimum voltage width, which are five specifications possessed by a hysteresis buffer circuit, Vtp is retrieved by binary search; the hysteresis minimum voltage width is recognized in a procedure of switching the object of the binary search to Vtm when the input voltage straddles Vtp (transition time from an L level to an H level) and switching it to the binary search of Vtp again when the input voltage straddles Vtm (transition time from the H level to the L level), and then the four remaining specifications are recognized while the binary search and the hysteresis minimum voltage width are recognized. COPYRIGHT: (C)2009,JPO&INPIT
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