发明名称 MANUFACTURING METHOD OF PROFILE SLICE SAMPLE
摘要 PROBLEM TO BE SOLVED: To efficiently shorten the manufacturing time of a slice sample for a transmission type electron microscope, and to make it less apt to cause release of the manufactured sample and embedding resin, while increasing the number of observable spots. SOLUTION: The manufacturing method of the profile slice sample for observing the cross section of a high-molecular weight membrane sample by the transmission electron microscope includes a process of superimposing a plurality of the high-molecular weight membrane samples one upon one another, a process of cutting a plurality of the superimposed samples, the process for placing the high-molecular weight membrane samples in a mold to embed them in resin, a process of curing the embedding resin and a process for slicing the cured resin block, in which the samples are embedded by an ultramicrotome. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009074984(A) 申请公布日期 2009.04.09
申请号 JP20070245265 申请日期 2007.09.21
申请人 TOPPAN PRINTING CO LTD 发明人 YAMAKAWA IKUKO
分类号 G01N1/28 主分类号 G01N1/28
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