| 摘要 |
PROBLEM TO BE SOLVED: To provide a lens defect inspection device capable of forming many parallel light sources having prescribed angles by the effective use of surface illuminations and a louver layer, for example, imaging accurately a defect on a lens appearance by an imaging means, and automating inspection. SOLUTION: This lens defect inspection device for inspecting a defect such as a flaw, a crack, a foreign substance or a bubble generated during the manufacturing of a lens being an inspection object comprises the surface illuminations; the louver layer arranged between the surface illuminations and the inspection object lens for using light irradiated from the surface illuminations as many parallel light sources; and the imaging means for imaging the light irradiated from the louver layer and transmitted through the inspection object lens. The louver layer has the first louver layer formed by arranging a light transmission band and a shielding band alternately for preventing the diffusion of light entering from the surface illuminations; and the second louver layer arranged in an orthogonal state with respect to the first louver layer formed by arranging a light transmission band and a shielding band alternately for preventing the diffusion of light entering from the surface illumination. COPYRIGHT: (C)2009,JPO&INPIT
|
