发明名称 APPARATUS AND METHODS FOR SCATTEROMETRY OF OPTICAL DEVICES
摘要 A system and method for measuring a dimension or angle of a feature of an optical device includes a light source and optics for focusing light from the light source onto a target area of the optical device. A light detector is positioned to detect scattered light from the target area, with the detected light used to create a measured light characteristic. A computer linked to the light detector performs a comparison algorithm on the measured light characteristic and outputs a numerical value of the dimension or angle measured. In method for designing an optical device, such as a photonic crystal for use on an LED, an intended scattered response based on light emission characteristics desired from the optical device is simulated. One or more design parameters of the optical device are varied.
申请公布号 WO2006110535(A3) 申请公布日期 2009.04.09
申请号 WO2006US13045 申请日期 2006.04.07
申请人 NANOMETRICS INCORPORATED;RYAN, TOM;RAYMOND, CHRIS;HUMMEL, STEVE 发明人 RYAN, TOM;RAYMOND, CHRIS;HUMMEL, STEVE
分类号 G01B11/14 主分类号 G01B11/14
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