发明名称 |
METHOD FOR MEASURING STRESS IN A WORKING STRUCTURE OR IN A COMPONENT PART OF A WORKING STRUCTURE |
摘要 |
A method for measuring stress in a working structure or in a component part of a working structure, wherein at least one stress sensor (3) is formed from a respective element of piezospectroscopically active material with a given piezospectroscopic coefficient (p), and by designing the element as a function of the physical characteristics and working conditions of the structure (2); the sensor (3) is made integral with the structure (2) so that the stress in the structure (2) is transmitted to the sensor (3); a first electromagnetic emission spectrum of the sensor (3) is acquired before the structure (2) is put into service, and a second electromagnetic emission spectrum of the sensor (3) is acquired after the structure (2) is put into service; the second electromagnetic emission spectrum is compared with the first electromagnetic emission spectrum to determine a spectrum shift (?v), which is processed with the piezospectroscopic coefficient (p) to obtain a stress measurement. |
申请公布号 |
WO2009022220(A3) |
申请公布日期 |
2009.04.09 |
申请号 |
WO2008IB02127 |
申请日期 |
2008.08.12 |
申请人 |
DELTATECH FONDRIEST IVAN GIOVANNI IMPRESA INDIVIDUALE;DE PORTU, GOFFREDO;FONDRIEST, IVAN, GIOVANNI |
发明人 |
DE PORTU, GOFFREDO;FONDRIEST, IVAN, GIOVANNI |
分类号 |
G01L1/24;G01M5/00 |
主分类号 |
G01L1/24 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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