发明名称 METHODS AND SYSTEMS FOR SEMICONDUCTOR TESTING USING A TESTING SCENARIO LANGUAGE
摘要 Methodology for semiconductor testing (100) includes one or more of the following stages defining a rule relating to semiconductor testion (104), validating the rule (108), bundling the rule with other rules (1 12), correlating the rule with other rules (1 16), publishing the rule (120), actualizing the rule (124), and follow up relating to the rule (130) Semiconductor testing system includes one or more of the following modules rule creation module(s), analysis module(s), simulation module(s), real time production module(s), and offline production module(s) GUI can be used for defining the building blocks of a rule and/or for viewing an optional hierarchy of categories to which the rule belongs
申请公布号 WO2007113805(A3) 申请公布日期 2009.04.09
申请号 WO2007IL00393 申请日期 2007.03.27
申请人 OPTIMALTEST LTD;BALOG, GIL 发明人 BALOG, GIL
分类号 G06F17/00;G06F9/44;G06F15/18;G06N5/02 主分类号 G06F17/00
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