发明名称 Halbleiterbauelement mit einer Metallisierung mit mehreren durch zumindest eine Barriereschicht getrennten Metallisierungsschichten sowie Verfahren zu dessen Herstellung
摘要 Semiconductor component comprises a semiconductor substrate (1) having a metallization (40) with a barrier layer (21, 22) arranged between metallization layers (11, 12, 13). At least one of the metallization layers is made from aluminum or aluminum alloy and the barrier layer is made from titanium, titanium nitride or nickel. The side of the metallization facing the substrate is formed as a metallization layer. An independent claim is also included for a process for producing a metallization on a semiconductor substrate.
申请公布号 DE102004036142(B4) 申请公布日期 2009.04.09
申请号 DE20041036142 申请日期 2004.07.26
申请人 INFINEON TECHNOLOGIES AG 发明人 AUERBACH, FRANZ;ROBOHM, CHRISTIAN
分类号 H01L23/485;H01L21/60;H01L23/522 主分类号 H01L23/485
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