| 摘要 |
<p>An integrated circuit includes a substrate, a storage device formed in the substrate (110) to hold bias settings and operational blocks (100, 102) formed in the substarte, each operational block ( including an operational circuit (130) and a charge pump (132) to provide well bias voltages to the operational circuit in response to one or more of the. bias settings (138). A method for testing an integrated circuit having two or more operational blocks includes : (a) determining a maximum operating speed of each of the blocks at a minimum supply voltage; (b) selecting a block that has a slow operating speed; (c) selecting a well bias to speed up the selected block; (d) selecting a supply- voltage to meet a target operating frequency at the selected well bias and measuring power; (e) repeating acts (b) - (d) while the measured power is less than a baseline power; and (f) saving the selected well bias and supply voltage settings for operation of the integrated circuit.</p> |
