发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT AND METHOD OF TESTING SAME
摘要 A semiconductor integrated circuit includes a semiconductor memory circuit, an address input unit to generate an input address and to input the input address into the semiconductor memory circuit, the address input unit repeating generating and inputting from a start address to a end address, and an output data processor to select a select data and to count a value of the select data. The input address specifies data stored in the semiconductor memory circuit. The select data is a count object of output data read out from the semiconductor memory corresponding to the input address.
申请公布号 US2009094494(A1) 申请公布日期 2009.04.09
申请号 US20080245395 申请日期 2008.10.03
申请人 NEC ELECTRONICS CORPORATION 发明人 TAKESHIMA TOSHIO
分类号 G06F11/273 主分类号 G06F11/273
代理机构 代理人
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