发明名称 METHOD FOR CLEANING WAFER
摘要 A method for cleaning a wafer is provided to remove the foreign material from a surface of a substrate by transmitting an ultrasonic wave to a film made of the isopropyl alcohol. A spin head(102) is rotated by a drive unit(104) in order to clean the wafer(W). Back-nozzles(124,126) are arranged through the internal center of the spin head. A nozzle unit(110) includes a spray nozzle(112) and a sonic vibrator(114). The nozzle unit supplies the cleaning solution to the surface of the wafer. The drive unit(106) reciprocates in an upper part of the wafer. The nozzle unit separates the foreign material from the surface of the wafer by vibrating the cleaning solution supplied to the surface of the wafer with the ultrasonic wave. A controller is electrically connected to the nozzle unit and the drive unit. The controller controls the operation of a wafer cleaning device(100).
申请公布号 KR20090035097(A) 申请公布日期 2009.04.09
申请号 KR20070100170 申请日期 2007.10.05
申请人 SEMES CO., LTD. 发明人 SONG, GIL HUN;KWON, OH JIN
分类号 H01L21/304 主分类号 H01L21/304
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