<p>The invention comprises a sensor (10), for use in an atomic force microscope, with a cantilever (20) having at least one detection tip (30) and a detection probe (40). The detection probe (40) is attached to the at least one detection tip (30) and has a detection tip contact surface (32) shaped to substantially mate to at least a portion of the detection probe (40). The invention also provides a method for the manufacture of a sensor in which a cantilever (20) with at least one detection tip (30) is truncated such that the at least one detection tip (30) has a detection tip contact surface (32) shaped to substantially mate to at least a portion of the detection probe (40). Finally the detection probe (40) is attached to the substantially mating detection tip contact surface (32).</p>
申请公布号
WO2009043368(A1)
申请公布日期
2009.04.09
申请号
WO2007EP10596
申请日期
2007.12.06
申请人
WESTFAELISCHE WILHELMS-UNIVERSITAET MUENSTER;SCHAEFER, MARCUS, MATTHIAS;SCHMUTZ, JAN-ERIK;HOELSCHER, HENDRIK
发明人
SCHAEFER, MARCUS, MATTHIAS;SCHMUTZ, JAN-ERIK;HOELSCHER, HENDRIK