发明名称 Method for producing a semiconductor device using a solder alloy
摘要 In producing a semiconductor device, a solder alloy is prepared to contain antimony in a range of from 3 to 5 wt %, a trace amount of germanium, and a balance of tin. An insulative substrate having conductor patterns on both surfaces thereof is prepared, and a heat sink plate is mounted on a back surface of the insulative substrate by a soldering process using the solder alloy at a temperature ranging from 310 C.° to 320 C.° in a hydrogen reducing furnace. A semiconductor chip is mounted on a front surface of the insulative substrate.
申请公布号 US2009093109(A1) 申请公布日期 2009.04.09
申请号 US20080213923 申请日期 2008.06.26
申请人 FUJI ELECTRIC DEVICE TECHNOLOGY CO., LTD. 发明人 MOROZUMI AKIRA;SOYANO SHIN;TAKAHASHI YOSHIKAZU
分类号 H01L21/768 主分类号 H01L21/768
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