发明名称 |
METHOD AND LIQUID FOR SILICON ANISOTROPIC ETCHING |
摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a method of silicon anisotropic etching that forms a slope WA that makes 45 degrees against the main surface SF of a silicon substrate 5 with favorable flatness and smoothness, and to provide a silicon anisotropic etching liquid for use in the method. <P>SOLUTION: In the method of the silicon anisotropic etching, a silicon substrate 5 is subjected to etching processing using a silicon anisotropic etching liquid in which polyoxyalkylene alkyl ether is added at a rate of 0.1 to 10 ppm to a hydroxylation tetramethylammonium aqueous solution of 20 to 25 mass%. <P>COPYRIGHT: (C)2011,JPO&INPIT</p> |
申请公布号 |
JP2010278371(A) |
申请公布日期 |
2010.12.09 |
申请号 |
JP20090131792 |
申请日期 |
2009.06.01 |
申请人 |
PANASONIC ELECTRIC WORKS CO LTD |
发明人 |
YAGYU HIROYUKI;YAMAJI TADAHIRO;SATO KAZUO |
分类号 |
H01L21/308;G02B6/122;G02B6/42;H01L21/306 |
主分类号 |
H01L21/308 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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