| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device capable of measuring a temperature of a semiconductor element on a real time basis. SOLUTION: The semiconductor device includes: a semiconductor laser 1 comprising a p-layer 11 and an n-layer 10; a pn junction formed of the p-layer 11 of the semiconductor laser 1 and an n-layer 15 electrically independent from the semiconductor laser 1; and a temperature measurement means for measuring the temperature of the semiconductor laser 1 on the basis of a potential difference when a current is applied to the pn junction in a forward direction. COPYRIGHT: (C)2011,JPO&INPIT
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