发明名称 METHOD OF MEASURING OPTIMAL SEEK TIME BY CONSIDERING MAGNETIC HEAD SETTLING TIME, AND INSPECTION DEVICE USING THIS MEASURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide an optimal seek time-measuring method which can measure and set up the optimal seek and improve the inspection throughput when inspecting a magnetic disk or a magnetic head, and to provide an inspection device using this measuring method. SOLUTION: This invention obtains differences between the positive-side average and the negative-side average of read signals for each sector throughout one track, writes the test data by calculating the seek time by changing the settling time using the maximum H and the minimum L of the differences, reads the test data and calculates the average variation DEV=(H-L)/(H+L), and obtains the minimum settling time out of the settling time whose average change DEV becomes equal to or smaller than a predetermined value, as the optimal settling time or the optimal seek time. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2010277638(A) 申请公布日期 2010.12.09
申请号 JP20090128633 申请日期 2009.05.28
申请人 HITACHI HIGH-TECHNOLOGIES CORP 发明人 SHIDARA KENICHI;MAEDA SUMIHIRO
分类号 G11B20/18;G11B21/10 主分类号 G11B20/18
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