发明名称 METHOD AND MEASURING DEVICE FOR GAUGING SURFACES
摘要 In a method for gauging surfaces (7″), in which a frequency-modulated laser beam is generated, the laser beam is emitted onto the surface as measuring radiation (MS), the measuring radiation (MS) backscattered from the surface (7″) is received and the distance between a reference point and the surface (7″) is measured interferometrically, wherein the measuring radiation (MS) is emitted and received while the surface to be gauged is being scanned, and a measuring arm and a reference interferometer arm with a partially common beam path are used, deviations from the essentially perpendicular impingement of the measuring radiation (MS) on the surface (7″) are taken into account algorithmically during distance measurement and/or are avoided or reduced during scanning by controlling the emission of the measuring radiation (MS).
申请公布号 US2010312524(A1) 申请公布日期 2010.12.09
申请号 US20080675191 申请日期 2008.08.22
申请人 LEICA GEOSYSTEMS AG 发明人 SIERCKS KNUT;JENSEN THOMAS;SCHNEIDER KLAUS
分类号 G06F17/50;G01B11/00 主分类号 G06F17/50
代理机构 代理人
主权项
地址