| 摘要 |
Provided is a test apparatus for testing a device under test, including: a level comparing section that receives a signal under test output from the device under test and outputs a logical value, the logical value indicating a comparison result obtained by comparing a signal level of the signal under test with preset first threshold and second threshold; an acquiring section that acquires the logical value output from the level comparing section, according to a strobe signal supplied thereto; an expected value comparing circuit that determines whether the logical value acquired by the acquiring section corresponds to a preset expected value; and a threshold control section that sets an upper limit and a lower limit of a voltage of the eye mask to the level comparing section as the first threshold and the second threshold, when an eye mask test is performed for determining whether an eye opening of the signal under test is larger than a predefined eye mask.
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