| 摘要 |
A clock signal test apparatus for testing a computer system includes a frequency generator to generate a clock pulse signal, a real-time clock (RTC) chip to receive the clock pulse signal from the frequency generator, and a micro control unit (MCU). The MCU is to receive a test command signal from the computer system to set a first current time of the RTC chip equal to a current system time of the computer system, and to receive a time comparing command from the computer system after a test interval to retrieve a second current time of the RTC chip and transmit the second current time of the RTC chip to the computer system.
|
