发明名称 LITHOGRAPHIC APPARATUS AND METHOD FOR ILLUMINATION UNIFORMITY CORRECTION AND UNIFORMITY DRIFT COMPENSATION
摘要 <p>PURPOSE: A lithographic apparatus for illumination uniformity correction and uniformity drift compensation is provided to reduce costs per device, to efficiently perform a lithographic process, and to minimize defects. CONSTITUTION: A lithographic apparatus comprises an illumination system for condition radiation beams. The illumination system includes a uniformity correction system positioned on a plane so that a fixed pupil is accommodated when lighted by the radiation beams. The uniformity correction system comprises fingers(708) and actuating devices for moving the corresponding fingers.</p>
申请公布号 KR20100129239(A) 申请公布日期 2010.12.08
申请号 KR20100051383 申请日期 2010.05.31
申请人 ASML NETHERLANDS B.V.;ASML HOLDING N.V. 发明人 ZIMMERMAN RICHARD CARL;VAN GREEVENBROEK HENDRIKUS ROBERTUS MARIE;KOCHERSPERGER PETER C.;DOWNEY TODD R.;STONE ELIZABETH;CSISZAR SZILARD ISTVAN;KUBICK FREDERICK;VLADIMIRSKY OLGA
分类号 G03F7/20;H01L21/027 主分类号 G03F7/20
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