发明名称 |
LITHOGRAPHIC APPARATUS AND METHOD FOR ILLUMINATION UNIFORMITY CORRECTION AND UNIFORMITY DRIFT COMPENSATION |
摘要 |
<p>PURPOSE: A lithographic apparatus for illumination uniformity correction and uniformity drift compensation is provided to reduce costs per device, to efficiently perform a lithographic process, and to minimize defects. CONSTITUTION: A lithographic apparatus comprises an illumination system for condition radiation beams. The illumination system includes a uniformity correction system positioned on a plane so that a fixed pupil is accommodated when lighted by the radiation beams. The uniformity correction system comprises fingers(708) and actuating devices for moving the corresponding fingers.</p> |
申请公布号 |
KR20100129239(A) |
申请公布日期 |
2010.12.08 |
申请号 |
KR20100051383 |
申请日期 |
2010.05.31 |
申请人 |
ASML NETHERLANDS B.V.;ASML HOLDING N.V. |
发明人 |
ZIMMERMAN RICHARD CARL;VAN GREEVENBROEK HENDRIKUS ROBERTUS MARIE;KOCHERSPERGER PETER C.;DOWNEY TODD R.;STONE ELIZABETH;CSISZAR SZILARD ISTVAN;KUBICK FREDERICK;VLADIMIRSKY OLGA |
分类号 |
G03F7/20;H01L21/027 |
主分类号 |
G03F7/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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