发明名称 |
Semiconductor test system |
摘要 |
A semiconductor test system includes: pin electronics (“PE”) cards each being operable to: a) apply a test pattern to device under tests (“DUTs”) each connected to the PE cards; b) capture patterns outputted in response to the test pattern from the DUTs; c) compare the patterns with an expected value pattern; and d) determine whether or not the patterns correspond with the expected value pattern, and a fail control card being operable to: e) aggregate fail information about the DUTs inputted through the PE cards every the DUTs; and f) transfer the fail information to the PE cards.
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申请公布号 |
US7849375(B2) |
申请公布日期 |
2010.12.07 |
申请号 |
US20080128057 |
申请日期 |
2008.05.28 |
申请人 |
YOKOGAWA ELECTRIC CORPORATION |
发明人 |
SAITO FUMIHIRO;MIYAZAKI NAOKI |
分类号 |
G06F11/00 |
主分类号 |
G06F11/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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