发明名称 Microlithographic exposure method as well as a projection exposure system for carrying out the method
摘要 In an exposure method for exposing a substrate which is arranged in the area of an image plane of a projection objective as well as in a projection exposure system for performing that method, output radiation directed at the substrate and having an output polarization state is produced. Through variable adjustment of the output polarization state with the aid of at least one polarization manipulation device, the output polarization state can be formed to approach a nominal output polarization state. The polarization manipulation can be performed in a control loop on the basis of polarization-optical measuring data.
申请公布号 US7847921(B2) 申请公布日期 2010.12.07
申请号 US20080177715 申请日期 2008.07.22
申请人 CARL ZEISS SMT AG 发明人 GRUNER TORALF;KRAEHMER DANIEL;TOTZECK MICHAEL;WANGLER JOHANNES;BROTSACK MARKUS;DIECKMANN NILS;GOEHNERMEIER AKSEL;SCHWAB MARKUS;FIOLKA DAMIAN;ZENZINGER MARKUS
分类号 G03B27/72;G03B27/54;G03F7/20 主分类号 G03B27/72
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