METHOD OF ESTIMATING SELF REFRESH PERIOD OF SEMICONDUCTOR MEMORY DEVICE

摘要

PURPOSE: A method for measuring the self-refresh period of a semiconductor memory device is provided to improve the productivity by sorting bad products in a semiconductor memory manufacturing process. CONSTITUTION: A plurality of internal address signals is initialized in response with a refresh reset signal(S710). The internal address signals are successively changed by being synchronized with an oscillation signal(S720). Based on the internal address signals, a refresh finishing signal is generated(S730). Based on the refresh reset signal and the refresh finishing signal, a self-refresh period is detected(S740).