发明名称 Method and apparatus for gas concentration quantitative analysis
摘要 An FTIR measurement is conducted on a background gas to obtain a single beam spectrum SB(BG) [C] and a synthetic single beam spectrum SSB(BG)[D], and an FTIR measurement is conducted on a sample gas to obtain a single beam spectrum SB(Samp)[E] and a synthetic single beam spectrum SSB(Samp)[F]. A double synthetic absorbance spectrum DSAbs of the sample gas as expressed by the following formula (Step T9) is calculated to obtain a concentration of a trace component (impurity) contained in the sample gas: DSAbs =−log[SB(Samp) SSB(BG)/SSB(Samp) SB(BG)]
申请公布号 US7847935(B2) 申请公布日期 2010.12.07
申请号 US20080050244 申请日期 2008.03.18
申请人 OTSUKA ELECTRONICS CO., LTD. 发明人 NITTA SATOSHI;OSAWA YOSHIHIRO
分类号 G01J3/42 主分类号 G01J3/42
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