摘要 |
By feeding inspection signals independent from each other to upper first and second gate lead inspection lines (52b, 52c), respectively, while maintaining the upper gate-side switching elements (40c) in an ON state, any short circuit between adjacent gate lines (40) of upper gate lines (40) and the like can be detected. By feeding inspection signals independent from each other to lower first and second gate lead inspection lines (53b, 53c), respectively, while maintaining lower gate-side switching elements (40c′) in an ON state, any short circuit between adjacent gate lines (40) of lower gate lines (40) and the like can be detected. By feeding inspection signals independent from each other to source lead inspection lines (55) while maintaining source-side switching elements (41) in an ON state, any short circuit between adjacent ones of source lines (41) and the like can be detected.
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