发明名称 Active matrix substrate, display device, and active matrix substrate inspecting method
摘要 By feeding inspection signals independent from each other to upper first and second gate lead inspection lines (52b, 52c), respectively, while maintaining the upper gate-side switching elements (40c) in an ON state, any short circuit between adjacent gate lines (40) of upper gate lines (40) and the like can be detected. By feeding inspection signals independent from each other to lower first and second gate lead inspection lines (53b, 53c), respectively, while maintaining lower gate-side switching elements (40c′) in an ON state, any short circuit between adjacent gate lines (40) of lower gate lines (40) and the like can be detected. By feeding inspection signals independent from each other to source lead inspection lines (55) while maintaining source-side switching elements (41) in an ON state, any short circuit between adjacent ones of source lines (41) and the like can be detected.
申请公布号 US7847577(B2) 申请公布日期 2010.12.07
申请号 US20070376045 申请日期 2007.03.12
申请人 SHARP KABUSHIKI KAISHA 发明人 YOSHIDA MASAHIRO;TANIMOTO KAZUNORI;MIMURA YASUHIRO
分类号 G01R31/00 主分类号 G01R31/00
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