发明名称 Method of making discrete trap memory (DTM) mediated by fullerenes
摘要 A discrete trap memory, comprising a silicon substrate layer, a bottom oxide layer on the silicon substrate layer, a Fullerene layer on the bottom oxide layer, a top oxide layer on the Fullerene layer, and a gate layer on the top oxide layer; wherein the Fullerene layer comprises spherical, elliptical or endohedral Fullerenes that act as charge traps.
申请公布号 US7847325(B2) 申请公布日期 2010.12.07
申请号 US20090403216 申请日期 2009.03.12
申请人 INFINEON TECHNOLOGIES AG 发明人 POEPPEL GERHARD;TEMPEL GEORG
分类号 H01L29/76;H01L21/02;H01L21/04;H01L21/336;H01L29/68;H01L29/788;H01L51/00 主分类号 H01L29/76
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