发明名称 |
MEMORY SYSTEM AND BAD BLOCK MANAGEMENT METHOD THEREOF |
摘要 |
PURPOSE: A memory system and a bad block management method thereof are provided to improve the efficiency of a memory block. CONSTITUTION: A first step is processed to determine that a memory block satisfies a bad block condition(S110). When the memory block satisfies the bad block condition, a subsequent treatment operates in the memory block(S120). The memory block is allocated to the bad block(S130). When the bad block satisfies a bad block release condition, the bad block is released. The subsequent treatment programs a cell in the erase state into a program state cell or stores the timing to assign the memory block as the bad block.
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申请公布号 |
KR20100127398(A) |
申请公布日期 |
2010.12.06 |
申请号 |
KR20090045827 |
申请日期 |
2009.05.26 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM, YONG JUN;KONG, JUN JIN;KIM, JAE HONG;YOO, HAN WOONG |
分类号 |
G06F12/06;G06F12/00;G06F12/16 |
主分类号 |
G06F12/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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