发明名称 SIZE DETECTION METHOD FOR PITTING SURFACE DFECTS WITH DUE ACCOUNT FOR CLOSED AREAS
摘要 A size detection method for pitting-like surface defects with due account for closed areas includes picture image analysis according to which with the help of image segmentation they determine areas corresponding to sample defects. On the image segmentation wit the help of multiple-level threshold discrimination they isolate areas corresponding to open defect areas as well as they take into account little informative areas around open defects which along with open defects are extracted by means of division of this image into fragments for each of them they build a local intensity histogram and separate local maximums on it where they form intensity clusters and find their centers. The set value of image segmentation thresholds is selected equal to the mean value of two adjacent cluster centers.
申请公布号 UA54276(U) 申请公布日期 2010.11.10
申请号 UA20100001786U 申请日期 2010.02.19
申请人 H.KARPENKO PHYSICAL-MECHANICAL INSTITUTE OF THE NAS OF UKRAINE 发明人 RUSYN BOHDAN PETROVYCH;POKHMURSKYI ANDRII YURIIOVYCH;KOSAREVYCH ROSTYSLAV YAROSLAVOVYCH
分类号 G06T7/60 主分类号 G06T7/60
代理机构 代理人
主权项
地址
您可能感兴趣的专利