发明名称 Event detection—apparatus and method for measuring the activity of neural networks
摘要 Apparatus for measuring neural network activity with a textured semiconductor substrate. Sensor elements have a respective detection electrode on the substrate surface for detecting neural network signals, and the detected neural signals are a basis for outputting electrical sensor output signals via respective sensor element outputs. Each amplifier element has an input and an output. Each of the sensor elements has associated therewith one of the amplifier elements whose input is connected to the sensor output of the respective sensor element. The amplified sensor output signal is output the amplifier output as an amplifier output signal. An activity evaluator has an input, which is connected to at least one of the amplifier outputs, and an output. The activity evaluation device produces an activity signal, which is a measure of activity of the neural network, based on the amplifier output signal, and outputs the amplifier output signal via the evaluation output.
申请公布号 US7809432(B2) 申请公布日期 2010.10.05
申请号 US20040964560 申请日期 2004.10.12
申请人 INFINEON TECHNOLOGIES AG 发明人 EVERSMANN BJORN-OLIVER;JENKNER MARTIN;PAULUS CHRISTIAN;THEWES ROLAND
分类号 A61B5/00;A61B5/04;G05B13/02;G06N3/06 主分类号 A61B5/00
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