发明名称 METHOD FOR FABRICATING MINUTE PATTERN IN SEMICONDUCTOR DEVICE
摘要 <p>PURPOSE: A minute pattern manufacturing method of a semiconductor is provided to form a greater number of line and space patterns in a pitch while maintaining the size and pitch of the pattern on a photo mask. CONSTITUTION: An etched layer(11) is formed on a substrate(10). A hard mask film is formed on an etched layer. A hard mask pattern(12B) is formed by etching the hard mask film. An oxidization film(15) is formed by oxidizing the hard mask pattern surface. An insulating layer(16), covering the oxidization film or the nitride film, is formed.</p>
申请公布号 KR20100107208(A) 申请公布日期 2010.10.05
申请号 KR20090025374 申请日期 2009.03.25
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KIM, DONG SEOK
分类号 H01L21/027 主分类号 H01L21/027
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