发明名称 Irradiation pattern data generation method, mask fabrication method, and plotting system
摘要 An irradiation pattern data generation method includes: a process for providing a design pattern having diagonal side portions that extend diagonally with respect to an X-axis direction and a Y-axis direction on an XY plane; a rectangular approximation process for approximating the design pattern to rectangles to generate a rectangular approximation pattern; a first correction process for shifting the side portions of the rectangular approximation pattern in the Y-axis direction to generate a first correction pattern; and a second correction process for enlarging the side portions of the first correction pattern in the X-axis direction and the Y-axis direction to generate an irradiation pattern.
申请公布号 US7810066(B2) 申请公布日期 2010.10.05
申请号 US20070866699 申请日期 2007.10.03
申请人 ELPIDA MEMORY, INC. 发明人 YASUZATO TADAO
分类号 G06F17/50;G03F1/76;G03F1/78;G03F7/20;H01L21/027 主分类号 G06F17/50
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