发明名称 |
Irradiation pattern data generation method, mask fabrication method, and plotting system |
摘要 |
An irradiation pattern data generation method includes: a process for providing a design pattern having diagonal side portions that extend diagonally with respect to an X-axis direction and a Y-axis direction on an XY plane; a rectangular approximation process for approximating the design pattern to rectangles to generate a rectangular approximation pattern; a first correction process for shifting the side portions of the rectangular approximation pattern in the Y-axis direction to generate a first correction pattern; and a second correction process for enlarging the side portions of the first correction pattern in the X-axis direction and the Y-axis direction to generate an irradiation pattern.
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申请公布号 |
US7810066(B2) |
申请公布日期 |
2010.10.05 |
申请号 |
US20070866699 |
申请日期 |
2007.10.03 |
申请人 |
ELPIDA MEMORY, INC. |
发明人 |
YASUZATO TADAO |
分类号 |
G06F17/50;G03F1/76;G03F1/78;G03F7/20;H01L21/027 |
主分类号 |
G06F17/50 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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