发明名称 Device and method for optometry
摘要 An eye examination apparatus 100 of the present invention comprises, a refractive power measuring section 50 for measuring refractive powers of subject eyes E of a subject in a binocular viewing state, an eye chart presenting section 30 for presenting a subjective measurement eye chart to be observed by the subject, a correcting section 40 for correcting the subject eyes by referring to data on the refractive powers measured with the refractive power measuring section 50 and using the subjective measurement eye chart presented in the eye chart presenting section 30 and an optical characteristics measuring section 10 for subjectively measuring an optical characteristic of the subject eyes E corrected or being corrected with the correcting section 40 in a state where the subject is binocularly viewing the subjective measurement eye chart.
申请公布号 US7806529(B2) 申请公布日期 2010.10.05
申请号 US20080056617 申请日期 2008.03.27
申请人 TOPCON CORPORATION 发明人 MIHASHI TOSHIFUMI;HIROHARA YOKO;KOBAYASHI MARIKO
分类号 A61B3/02;A61B3/10 主分类号 A61B3/02
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