发明名称 Variable sector-count ECC
摘要 Improved memory devices, circuitry, and data methods are described that facilitate the detection and correction of data in memory systems or devices by increasing the data area of user data being covered by the ECC code. This averages any possible bit errors over a larger data area and allows a greater number of errors to be corrected by combining the ECC codes in the coverage area without substantially changing the overall size of ECC codes being stored over a single sector approach. In one embodiment of the present invention, the size of the data block utilized for ECC coverage is variable and can be selected such that differing areas of the memory array or data types can have a differing ECC data coverage sizes. It is also noted that the ECC algorithm, math base or encoding scheme can also be varied between these differing areas of the memory array.
申请公布号 US7810017(B2) 申请公布日期 2010.10.05
申请号 US20060384965 申请日期 2006.03.20
申请人 MICRON TECHNOLOGY, INC. 发明人 RADKE WILLIAM H.
分类号 G11C29/00 主分类号 G11C29/00
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