发明名称 Chemical mechanical polishing pad having secondary polishing medium capacity control grooves
摘要 A chemical mechanical polishing pad (104, 400) that includes a polishing layer (108, 420, 500) having a set of primary grooves (124, 408, 516) formed in a polishing surface (110, 428, 520) of the pad. The pad also includes a set of secondary grooves (128, 404, 504) that become selectively active as a function of the wear of the polishing layer from polishing.
申请公布号 US7807252(B2) 申请公布日期 2010.10.05
申请号 US20060437050 申请日期 2006.05.19
申请人 ROHM AND HAAS ELECTRONIC MATERIALS CMP HOLDINGS, INC. 发明人 HENDRON JEFFREY J.;MULDOWNEY GREGORY P.
分类号 B24B3/30;B24B1/00;B24B37/20;H01L21/304 主分类号 B24B3/30
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