Memory stack probe card and test method using it,申请号KR20080112678-传众专利搜索

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发明名称	Memory stack probe card and test method using it
摘要
申请公布号	KR100984682(B1)	申请公布日期	2010.10.04
申请号	KR20080112678	申请日期	2008.11.13
申请人		发明人
分类号	H01L21/66;G01R1/073	主分类号	H01L21/66
代理机构		代理人
主权项
地址

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