发明名称 High capacitance load testing
摘要 A circuit for controlling a voltage across a device and permitting measurement of a current through the device includes a sense impedance in series combination with, the device, a sensed voltage measured across the sense impedance being representative of the current through the device; a capacitive stability element in parallel combination with the sense resistance, the capacitive stability element being virtually absent by connection to a virtual version of the sensed voltage when the device has a first capacitance and being present when the device has a second capacitance, the second capacitance being larger than the first capacitance.
申请公布号 US7800380(B1) 申请公布日期 2010.09.21
申请号 US20070844615 申请日期 2007.08.24
申请人 KEITHLEY INSTRUMENTS INC. 发明人 BANASKA JOHN G.;ROBERTS GREGORY
分类号 G01R27/08 主分类号 G01R27/08
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