发明名称 On-die termination circuit of semiconductor memory apparatus
摘要 An on-die termination circuit of a semiconductor memory apparatus includes a comparator that compares a voltage corresponding to a normal code with a reference voltage to output a comparison signal. A code adjusting unit varies the normal code according to the comparison signal, outputs the varied normal code, and resets the normal code to a predetermined reset code or a variable fuse code.
申请公布号 US7800397(B2) 申请公布日期 2010.09.21
申请号 US20070878924 申请日期 2007.07.27
申请人 HYNIX SEMICONDUCTOR INC. 发明人 PARK JUNG-HOON
分类号 H03K17/16;H03K19/003 主分类号 H03K17/16
代理机构 代理人
主权项
地址