发明名称 Ferroelectric random access memory apparatus and method of driving the same
摘要 In a ferroelectric random access memory device that can allow a stable burst read operation and a method of driving a ferroelectric random access memory device thereof, the ferroelectric random access memory device comprises first and second memory cell sections, each comprising a plurality of ferroelectric memory cells, and a read circuit that sequentially performs a burst read operation on the first and second memory cell sections such that a read operation of the first memory cell section partially overlaps a read operation of the second memory cell section. When a chip is disabled during the read operation of the first memory cell section, the read circuit writes back data in the second memory cell section in response to the extent to which the read operation of the second memory cell section has been performed.
申请公布号 US7800931(B2) 申请公布日期 2010.09.21
申请号 US20080228590 申请日期 2008.08.14
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 MIN BYUNG-JUN;LEE KANG-WOON;LEE HAN-JOO;JEON BYUNG-GIL
分类号 G11C11/22 主分类号 G11C11/22
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