发明名称 MOSFET device featuring a superlattice barrier layer and method
摘要 A method of forming a semiconductor structure includes forming a channel layer; forming a superlattice barrier layer overlying the channel layer, and forming a gate dielectric overlying the superlattice barrier layer. The superlattice barrier layer includes alternating first and second layers of barrier material. In addition, the superlattice barrier layer is configured for increasing a transconductance of the semiconductor device by at least a factor of three over a semiconductor device absent such superlattice barrier layer.
申请公布号 US7799647(B2) 申请公布日期 2010.09.21
申请号 US20070831394 申请日期 2007.07.31
申请人 FREESCALE SEMICONDUCTOR, INC. 发明人 DROOPAD RAVINDRANATH;PASSLACK MATTHIAS;RAJAGOPALAN KARTHIK
分类号 H01L21/336;H01L31/00 主分类号 H01L21/336
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